Accession Number:

ADA455553

Title:

Microstructure of Conventional and Reduced Sensitivity RDX

Descriptive Note:

Final rept. Jul-Dec 2005

Corporate Author:

FRAUNHOFER-INST FUER CHEMISCHE TECHNOLOGIE BERGHAUSEN (GERMANY F R)

Personal Author(s):

• Herrmann, Michael J.
• Ludwig, Bastian

Report Date:

2005-12-01

Pagination or Media Count:

18.0

Abstract:

This report results from a contract tasking Fraunhofer Institute for Chemical Technology as follows Reduced Sensitivity RS energetic materials are in the scope of interest, particularly, for the development and refinement of IM PBX as PBXN-109. Such improved versions of current explosive ingredients as RDX and HMX facilitate progress in times of limited funding, as an introduction of new ingredients as FOX-7 would give rise to considerably higher costs. However the mechanisms behind the sensitivity reduction are far from being clear. Particle size, shape, surface morphology, voids, inclusions and impurities, lattice dislocations and deformation twinning of ingredients as RDX and HMX have been discussed to influence the mechanical sensitivity. Within the last years X-ray diffraction methods have been elaborated and refined at ICT, particularly for investigating micro strain in energetic materials, These methods shall now be tested for characterizing and distinguishing reduced sensitivity from conventional RDX. A sample portfolio of different crystal qualities of RDX will be collected, including conventional and reduced sensitivity samples, and the samples will be investigated with advanced X-ray diffraction techniques.

Descriptors:

• *MICROSTRUCTURE
• *X RAY DIFFRACTION
• *INSENSITIVE EXPLOSIVES
• *RDX
• CRYSTAL STRUCTURE
• SENSITIVITY
• GERMANY

Subject Categories:

• Ammunition and Explosives
• Crystallography

Distribution Statement:

APPROVED FOR PUBLIC RELEASE