Time-Resolved Scanning Electron Microscopy
Final rept. 16 Jun 2003-15 Jun 2006
BROWN UNIV PROVIDENCE RI
Pagination or Media Count:
The project explores the combination of ultrashort pulsed laser technology with electron microscopy. The objective is to build an electron microscope with a pulsed electron beam, in order to observe nanoscale structures with ultrafast time-resolution. The pulsed electron beam is obtained by rapidly switching the electron emission of a field emission tip using the AC electric field arising from exposure to the intense electromagnetic radiation emanating from an ultrashort pulsed laser. Space-charge interactions between electrons within the electron beam are minimized by constraining the number of electrons per pulse to less than about 10. The following operating parameters are targeted Spatial resolution 2 nm Temporal resolution 3 ps Ultrafast-pulsed electron microscopy could open up the wide and important field of dynamical processes in materials that are of nanotechnological importance.
- Electrical and Electronic Equipment
- Lasers and Masers
- Electrooptical and Optoelectronic Devices