Accession Number:

ADA455073

Title:

Synchrotron Based X-Ray Strain Mapping in Fatigued Materials Subjected to Overloading

Descriptive Note:

Conference paper

Corporate Author:

RUTGERS - THE STATE UNIV NEW BRUNSWICK NJ

Personal Author(s):

• Tsakalakos, Thomas
• Croft, Mark C.
• Zhong, Z,
• Holtz, R.
• Sadananda, K.

Report Date:

2006-01-01

Pagination or Media Count:

11.0

Abstract:

The application of high-resolution strain mapping in large engineering samples with both high-spatial and strain resolution is reviewed in this report using high- energy photons between 100 and 300 KeV on beam line X17B1 of Brookhaven National Laboratory. This was achieved by using Energy Dispersive X-ray Diffraction EDXRD methods and synchrotron radiation for the nondestructive measurement of residual stresses in engineering components. Examples of residual stresses profiles will be presented which include laser and shot peening and fatigue crack stress fields. The presented results have been validated with other methods such as FE and other model predictions. This technique represents a significant development in the in life prediction of engineering structures including large naval structures.

Descriptors:

• *CRACKING(FRACTURING)
• *X RAY DIFFRACTION
• *FATIGUE(MECHANICS)
• *SYNCHROTRONS
• *SYNCHROTRON RADIATION
• STRESSES
• MEASUREMENT
• NONDESTRUCTIVE TESTING
• ENERGY
• WELDMENTS
• ENGINEERING
• SAMPLING
• SHOT PEENING
• DISPERSIONS
• PHOTONS
• RESIDUAL STRESS
• PROFILES
• LASERS
• STRUCTURES
• CRACKS
• PREDICTIONS
• NAVY

Subject Categories:

• Particle Accelerators
• Nuclear Physics and Elementary Particle Physics
• Mechanics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE