Accession Number:

ADA445149

Title:

The Importance of Network Structure in High-K Dielectrics: LaAlO3, Pr2O3, and Ta2O5

Descriptive Note:

Journal article

Corporate Author:

AIR FORCE RESEARCH LAB KIRTLAND AFB NM SPACE VEHICLES DIRECTORATE

Personal Author(s):

Report Date:

2005-08-19

Pagination or Media Count:

6.0

Abstract:

Measurements of the dielectric constant of amorphous and crystalline Pr2O3 are reported. The high value -25 for the polycrystalline phase is discussed in terms or the network structure and comparison is made with heavy rare-earth oxide values. The specific cases of LaAlO1 and Ta2O5 are also discussed and the role of network structure evidenced and elucidated. A potential route to finding high kappa materials suitable for microelectronics applications is suggested.

Subject Categories:

  • Miscellaneous Materials
  • Electricity and Magnetism
  • Electrical and Electronic Equipment

Distribution Statement:

APPROVED FOR PUBLIC RELEASE