Accession Number:

ADA433606

Title:

Measurements of Secondary Electron Yield From Materials With Application to Depressed Collectors

Descriptive Note:

Final technical rept. 1 Jan 2001-31 Dec 2004

Corporate Author:

NEW MEXICO UNIV ALBUQUERQUE DEPT OF ELECTRICAL ENGINEERING AND COMPUTER SCIENCE

Personal Author(s):

Report Date:

2005-03-22

Pagination or Media Count:

20.0

Abstract:

This final technical report summarizes the research activities over the last year of this grant. New time-dependent secondary electron yield S.E.Y measurements, including both true secondary emission and backscattering, have been made on materials thought to be suitable for low yield vacuum electronic applications such as collectors in High Power Microwave HPM tubes and beam-facing components in particle accelerators. Measurements of the angular dependence of S.E.Y. have also been performed and compared well with the literature. Boron-carbide-sprayed copper substrates, provided by Calbazas Creek Research, Inc., have also been initially characterized, and will be presented in a paper at IVEC 2005. The dependence of true secondaries on incident beam energy has been measured, but its intepretation has yet to be cormpleted. These 0pen questions will be resolved under the auspices of a follow-on grant.

Subject Categories:

  • Electrical and Electronic Equipment
  • Nuclear Physics and Elementary Particle Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE