Accession Number:

ADA429378

Title:

Issues of Compatibility Between Nanomaterials and Aluminum Scanning Electron Microscopic Mounts

Descriptive Note:

Final rept. Mar 2003-Aug 2004

Corporate Author:

ARMY RESEARCH LAB ABERDEEN PROVING GROUND MD WEAPONS AND MATERIALS RESEARCH DIRECTORATE

Personal Author(s):

Report Date:

2004-12-01

Pagination or Media Count:

18.0

Abstract:

Aluminum mounts are ubiquitously present in scanning electron microscope SEM laboratories. They are an inexpensive light material with good conductivity properties, and are generally compatible with conductive adhesive products. In the course of using aluminum mounts to examine nanoscale materials, some compatibility issues were revealed. One limiting issue was charge conduction. Nanoscale materials can be a more efficient conductor of electrons than the aluminum mount with its layer of oxides. The design of the SEM can constrain charge dissipation. These topics are discussed in summarized form using examples from nanotube dispersion research.

Subject Categories:

  • Electrical and Electronic Equipment
  • Properties of Metals and Alloys

Distribution Statement:

APPROVED FOR PUBLIC RELEASE