Micromechanics Study of a Polymer with/without Microparticles
AIR FORCE RESEARCH LAB EDWARDS AFB CA SPACE AND MISSILE PROPULSION DIV
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SIEM Speckle Interferometry with Electron Microscopy is a micronano experimental mechanics technique that is able to perform the full field displacement mapping over a region of only several microns in size. In this study we tested specimens made of a pure binder material, a polymer, and binder material mixed with 6 micron aluminum particles under uniaxial tension. The binder material with microparticles was made by adding 10 by weight aluminum particles into the pure binder material. The technique SIEM was used to map the strain distributions of the specimen under various magnifications, 40x, 200x, 800x, and 1500x. The relationships between the coefficient of variation of epsilonsub yy, epsilonsub xx and the examined area were obtained. We found at magnification about 200x the microstructure had a significant effect on the strain distributions in the binder material with microparticles whereas, for pure binder material, the effect was not observed until at 1500x.
- Polymer Chemistry