X-ray Diffractometer for Texture and Residual Stress Studies of Advanced Materials
Final rept. 1 Apr 2000-31 Mar 2002
PENNSYLVANIA STATE UNIV UNIVERSITY PARK DEPT OF MATERIALS SCIENCE AND ENGINEERING
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Through AFOSR DURIP grant F49620-00-1-0245, a four circle goniometer x-ray diffractometer outfitted with a high temperature stage was purchased from Philips Analytical. The instrumentation facilitates residual stress measurements in highly textured materials up to 900 deg C. The instrument has significantly enhanced the AFOSR funded research efforts of the Pl on directionally solidified ceramic eutectics. Initial studies have measured the residual stresses in highly textured AlO3-ZrO2Y2O3 eutectics as a function of temperature. At room temperature, significant compressive stresses 450 MPa are present in Al2O3 with corresponding tensile stresses in ZrO2. Through high temperature studies, the stress-free temperature was found to be 675 deg C.
- Ceramics, Refractories and Glass