Accession Number:

ADA422012

Title:

X-ray Diffractometer for Texture and Residual Stress Studies of Advanced Materials

Descriptive Note:

Final rept. 1 Apr 2000-31 Mar 2002

Corporate Author:

PENNSYLVANIA STATE UNIV UNIVERSITY PARK DEPT OF MATERIALS SCIENCE AND ENGINEERING

Personal Author(s):

Report Date:

2003-07-01

Pagination or Media Count:

7.0

Abstract:

Through AFOSR DURIP grant F49620-00-1-0245, a four circle goniometer x-ray diffractometer outfitted with a high temperature stage was purchased from Philips Analytical. The instrumentation facilitates residual stress measurements in highly textured materials up to 900 deg C. The instrument has significantly enhanced the AFOSR funded research efforts of the Pl on directionally solidified ceramic eutectics. Initial studies have measured the residual stresses in highly textured AlO3-ZrO2Y2O3 eutectics as a function of temperature. At room temperature, significant compressive stresses 450 MPa are present in Al2O3 with corresponding tensile stresses in ZrO2. Through high temperature studies, the stress-free temperature was found to be 675 deg C.

Subject Categories:

  • Ceramics, Refractories and Glass
  • Optics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE