Accession Number:

ADA416265

Title:

Soft X-Ray Microscopy and Metrology

Descriptive Note:

Final rept. 1 May 1996-31 Oct 2001

Corporate Author:

CALIFORNIA UNIV BERKELEY ELECTRONICS RESEARCH LAB

Personal Author(s):

Report Date:

2001-10-01

Pagination or Media Count:

47.0

Abstract:

This AFOSR grant has been used to support graduate students in the areas of coherence and microscopy at soft x-ray wavelengths. Techniques were developed for characterizing the spatial coherence of undulator radiation, table top soft x-ray lasers, and high harmonic generation of femtosecond pulses at short wavelengths, all in the 1-50 nm wavelength regime. With varying additional attributes, all three sources provide radiation exhibiting a high degree of spatial coherence. In the area of high resolution soft x-ray microscopy, a spatial resolution of 23 nanometers has been demonstrated using new, best-in-the-world, Fresnel zone plate lenses, special nanometer test patterns, and bending magnet radiation in the 1-4 nm region. State-of-the-art images have been obtained of magnetic recording materials with sub-5O nm domains, cryo-prepared biological samples showing detailed views of cells and sub-cellular structures, and modern nanochip interconnects. A new text has been published D. Attwood, Soft X-rays and Extreme Ultraviolet Radiation Principles and Applications Cambridge Univ. Press, UK 2000. Several reprints are attached Soft X-ray Microscopy to 25 nm with Applications to Biology and Magnetic Materials NIM A, v467-468, p841-844, 2001 Spatial Coherence and Properties of Undulator Radiation Based on Thompson-Wolf Two-pinhole Measurement NIM A, v467-468, p913-916, 2001 Spatial Coherence Characterization of Undulator Radiation Optics Communications, v182, p25-34, 2000 Achievement of Essentially Full Spatial Coherence in a High-Average-Power Soft X-ray Laser Phys. Rev. A, v63 n3, p33802-1 to 33802-5, 2001 Nanofabrication and Diffractive Optics for High-Resolution X-ray Applications J. Vac. Sci. Technol. B, v18 n6, p2970-2975, Nov-Dec 2000 High-Resolution Soft X-ray Microscopy Proc. of SPIE Reprint, v4146, p171-175, 2000 Experimental Analysis of High-Resolution Soft X-ray Microscopy Proc. of SPIE Reprint, v4499, p134-141, 2001.7

Subject Categories:

  • Lasers and Masers
  • Atomic and Molecular Physics and Spectroscopy
  • Nuclear Physics and Elementary Particle Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE