Accession Number:

ADA411490

Title:

Acquisition of a High-Resolution Field Emission Electron Microscope for Nanoscale Materials Research and Development

Descriptive Note:

Final rept. 1 May 2001-31 Jul 2002

Corporate Author:

VIRGINIA UNIV CHARLOTTESVILLE DEPT OF MATERIALS SCIENCE AND ENGINEERING

Personal Author(s):

Report Date:

2002-07-01

Pagination or Media Count:

14.0

Abstract:

Funds are requested for the purchase of a quantitative field emission gun FEG scanning electron microscope SEM at the University of Virginia UVa. This quantitative microscope will contain a 25 kV Schottky FEG, energy dispersive x-ray spectrometer EDS, in-situ nano-lithography system, chemical mapping and orientation imaging and strain analysis capabilities. The instrument will allow quantitative imaging and compositional analyses to be performed on all types of materials with high spatial resolution at low accelerating voltages 2.5 nm at 1 keV, for example, and it is essential for many current materials research programs within the School of Engineering and Applied Science SEAS at UVa. The increased resolution that a FEG SEM delivers will be a centerpiece for future research and development and characterization of nanoscale materials ranging from metals, electronic, and biological materials within SEAS and the College of Arts and Sciences, as well as for nearby academic institutions and industries. The new microscope is required to replace the existing SEMs, which are seriously outdated. It is clear that the new state-of-the-art SEM is required as a starting base in order to develop new materials in the nanoscale class that the DoD and the rest of the research community are pushing towards. The current SEMs have effectively served UVa in an efficient manner, providing over 15 years of continuous use for materials research. UVa has faculty and staff with sufficient expertise in SEM techniques to ensure that the new instrument is utilized for the highest quality materials research and that it is maintained at an optimum level of performance. The current track record that UVa has with other analytical instruments in the past are a strong testament to this infrastructure and we are confident this will continue in the future.

Subject Categories:

  • Electrooptical and Optoelectronic Devices
  • Laminates and Composite Materials

Distribution Statement:

APPROVED FOR PUBLIC RELEASE