Accession Number:

ADA411368

Title:

In-Situ Single DNA Manipulation with phi 20nm Electron-Beam-Deposited Probe

Descriptive Note:

Conference paper

Corporate Author:

TOKYO UNIV (JAPAN) FACULTY OF ENGINEERING

Report Date:

2001-10-25

Pagination or Media Count:

5.0

Abstract:

This paper proposes a novel DNA-sequencing- preprocessing that can selectively extract a specific part of a single molecular DNA fiber by in-situ manipulation. The in-situ manipulation extends DNA fibers on a glass substrate, cuts into several DNA fragments, and isolates a specific DNA fragment. In this method full-time observation of the manipulation is provided for the purpose of keeping the information about where the isolated DNA fragment used to he located in the original DNA fiber. A hook-shaped phi 20 nm probe was fabricated by Electron-Beam-Deposition for isolating the DNA fragment. With this probe, the DNA fragment, extended on the surface of water-repellent with its end anchored by An colloid, was hooked and lifted up from the glass substrate water-repellent has an effect of preventing adsorption between the DNA fragment and the glass substrate. Finally, the specific DNA fragment was successfully isolated onto a new clean glass substrate.

Subject Categories:

  • Genetic Engineering and Molecular Biology

Distribution Statement:

APPROVED FOR PUBLIC RELEASE