Accession Number:

ADA394926

Title:

Scanning Probe Microscope

Descriptive Note:

Final technical rept. 1 Apr 1999-31 Mar 2001

Corporate Author:

PURDUE RESEARCH FOUNDATION LAFAYETTE IN

Personal Author(s):

Report Date:

2001-03-31

Pagination or Media Count:

5.0

Abstract:

This DURIP allowed us to purchase a Digital Instruments Dimension 3100 Atomic Force Microscope AFM, which is a versatile tool that can serve dual functions, both as an AFM and a scanning-tunneling microscope STM . The AFM and the STM are separated units and are mounted on two different stages both of which minimize external noise and vibration. Within the purview of each of these units lie several modes of imaging. As an AFM, imaging is done in two modes namely the tapping mode and the contact mode. These modes have the capability of resolving step heights of a few angstroms and have a be done in several ways depending upon the kind of atoms that one is imaging.

Subject Categories:

  • Test Facilities, Equipment and Methods
  • Optics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE