An Inverse Approach for Capturing the Interaction of Macro- and Micro-Scales in Characterizing Bonded Composite Joints
Final rept. 01 Apr 1999-31 Mar 2000
ARIZONA UNIV TUCSON DEPT OF AEROSPACE AND MECHANICAL ENGINEERING
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As part of the DURIP Equipment Grant from AFOSR with Contract No. F4962099- 1.0216, a technique has been developed to determine the critical interface fracture parameters of dissimilar material interfaces. This technique combines the experimental measurements at the micro-scale and analytical and numerical modeling at the macro-scale. With this grant, our Hitachi scanning electron microscope SEM, backscatter, and X-ray, Model X-650, has been upgraded with a new 100-lb tensile sub-stage, three-point bending fixture load cell, and an extensometer, heating and cooling accessory -130 deg C to 200 deg C. Also, the SEM has been refurbished with a Kevex-SIGMA fully loaded KS2 Level 2 microanalysis system with Digital Imaging and spectral processing model. With this instrumentation, the SEM provides the capability to characterize material at the micro-level, and permits capturing the effect of micro-properties in macro-analysis when determining engineering properties useful in design. As part of this grant, two graduate students involved in the research project funded by Semiconductor Research Corporation SRC have benefited significantly. Also, an undergraduate student received a summer internship from SRC to work on interface characterization with this technique.
- Electrical and Electronic Equipment
- Laminates and Composite Materials