Optimization of a Multilayer Photothermal Sensor for Infrared Spectroscopy
AIR FORCE INST OF TECH WRIGHT-PATTERSONAFB OH SCHOOL OF ENGINEERING
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Tri-layer thermal diffusion modeling was applied to the optimization of a multi-layer reed sensor for use in a photothermal infrared detector. The multi-layer reed sensor deflects in response to increased temperature. Deflection, of angstroms or larger, is measured using an atomic force microscope. A newly developed thermal diffusion model for three layer reeds was combined with an existing two-layer cantilever model, in order to explore the effects of length, operating frequency, and layer thickness on signal to noise ratio. Model behavior is presented, and compared to laboratory results.
- Infrared Detection and Detectors