Macromodeling Electromagnetic Effects in Circuits
Final technical rept. Oct 94-Jul 96
CALSPAN UB RESEARCH CENTER BUFFALO NY
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This report presents results of an investigation to develop CAD macromodels for simulating and assessing electromagnetic EM effects in linear and digital ICs. The effects of interest are any unintended IC responses due to inadvertently or intentionally coupled EM energy entering into any accessible ports on the victim circuit. Assessments of possible EM effects require robust methodology to encompass a variety of coupling waveforms and conditions. In this study, both Thevenin and Norton sources were used as equivalent circuits for coupling the intrusive EM fields. Both digital and linear ICs were used as victim circuits to determine and benchmark performance of the candidate macros. Three ICs of representative families, however, were specifically selected for bench marking because they are used in current and planned Air Force Systems. In addition, other contemporary linear ICs and OpAmps were used in various circuit configurations to demonstrate use of the EM assessment macromodels.
- Electrical and Electronic Equipment
- Electricity and Magnetism