WOCSDICE 97: 21st Workshop on Compound Semiconductor Devices and Integrated Circuits Held on May 25-28 1997 in Scheveningen, The Netherlands
EINDHOVEN UNIV OF TECH (NETHERLANDS)
Pagination or Media Count:
Partial contents Reliability and degradation of HEMTs and HBTs High Temperature Operation of GaAs Based HFET Structure Containing Layers Grown at Low Temperature Application of Semiconductor Interface Modelling to Reliability Characterisation Metal probe technique for characterisation of semiconductor materials used in optoelectronic devices A Novel Approach for Determining the Reliability of AlGaAsGaAs HBTs from Low-Frequency Noise Characteristics Optoelectronics Photonic Integrated Circuits for multiwavelength applications Polarization independent InGaAsInP chopped quantum well interferometric space switch at 1.55 pm Design and analysis of a 1 x 8 wavelength division multiplexer based on the self-imaging theory Design and analysis of a 1 x 32 tapered coupler based on the self-imaging theory.
- Electrical and Electronic Equipment