Accession Number:

ADA329788

Title:

Plasma Immersion Ion Implantation Process for Semiconductor Fabrication. Linear & Reentrant Crossed-Field Amplifiers for in situ Measurements, Comparisons with Numerical Simulations and Study of Noise Mechanisms.

Descriptive Note:

Final rept. 30 Dec 93-29 Dec 96,

Corporate Author:

NORTHEASTERN UNIV BOSTON MA DEPT OF ELECTRICAL AND COMPUTER ENGINEERING

Personal Author(s):

Report Date:

1996-12-01

Pagination or Media Count:

28.0

Abstract:

We have performed in situ measurements in two low frequency CFAs to study several basic physics issues which may lead to CFA noise reduction. Our measurements include the local radio-frequency RF fields, electron density profiles, electron energy distributions and noise spectrums in both the linear CFA and the reentrant CFA. Comprehensive electron density measurements of the interaction region as well as parametric comparisons such as gain versus sole voltage, beam current and frequency have been used to benchmark two computer simulation codes, MASK and NESSP.

Subject Categories:

  • Manufacturing and Industrial Engineering and Control of Production Systems
  • Plasma Physics and Magnetohydrodynamics
  • Radiofrequency Wave Propagation

Distribution Statement:

APPROVED FOR PUBLIC RELEASE