Accession Number:

ADA326840

Title:

Development and Application of In-Situ, Real Time and Ex-Situ Characterization Techniques to Study the Growth of High Temperature Superconducting (HTSC) Films and Interfaces,

Descriptive Note:

Corporate Author:

NORTH CAROLINA UNIV AT CHAPEL HILL DEPT OF CHEMISTRY

Personal Author(s):

• Irene, Eugene A.
• Auciello, O.
• Krauss, A. R.
• McGuire, G. E.

Report Date:

1997-06-27

Pagination or Media Count:

11.0

Abstract:

The objectives of this program are 1 To demonstrate Time of Flight Ion Scattering and Recoil ToF-ISARS Spectroscopy and Spectroscopic Ellipsometry SE for in-situ and real time characterization of HTSC thin films and processes. 2 To study HTSC thin film processes and interface reactions.

Descriptors:

• *THIN FILMS
• *HIGH TEMPERATURE SUPERCONDUCTORS
• IONS
• SCATTERING
• REAL TIME
• SPECTROSCOPY
• INTERFACES
• EPITAXIAL GROWTH
• SURFACE REACTIONS
• ELLIPSOMETERS

Subject Categories:

• Physical Chemistry
• Atomic and Molecular Physics and Spectroscopy
• Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE