Accession Number:

ADA317616

Title:

X-Ray Diffraction Characterization of Process-Induced Residual Stress.

Descriptive Note:

Summary rept. Jan 90-Dec 94,

Corporate Author:

ARMY RESEARCH LAB ABERDEEN PROVING GROUND MD

Personal Author(s):

Report Date:

1996-09-01

Pagination or Media Count:

27.0

Abstract:

The U.S. Army Research Laboratory - Materials Directorate ARL-MD has utilized the x-ray diffraction XRD method of residual stress analysis RSA to characterize process-induced residual stress on a variety of polycrystalline metal and ceramic materials. As part of the mechanical failure investigation, modem XRD RSA techniques provide a direct means for quantifying residual stress at the component surface - the location at which most fatigue and stress corrosion cracks originate. Therefore, an understanding of the magnitude and distribution of residual stresses introduced from processing is important when predicting failure modes through fracture mechanics calculations and service loads by finite element modeling. This report discusses the procedures for and results from XRD residual stress measurement on the following differently processed material systems shot-peened stainless steel, quenched and tempered and welded armor steel, autofrettage gun tube steel, and ground alumina ceramic.

Subject Categories:

  • Ceramics, Refractories and Glass
  • Properties of Metals and Alloys

Distribution Statement:

APPROVED FOR PUBLIC RELEASE