Uncertainties in Reflectance Measurements Made on the NRL Beam Line X24C.
NAVAL RESEARCH LAB WASHINGTON DC
Pagination or Media Count:
A comprehensive attempt has been made to identify and quantify sources of uncertainty associated with measurements made with the reflectometer on the NRL beam line X24C. Measuremental uncertainty is dominated by angular reproducibility in the reflectometer and the stability of the electron beam. At wavelengths near the silicon L edge, the error in wavelength scale, set by the monochromator, is about 0.3 Angstroms. In samples with good signal to noise, the error in the reflectance is about 1 of the value of the reflectance. The error is correlated with the slope of the reflectance profile, varying between 1 of the reflectance value where the slope is flat to 10 of the reflectance value where the slope is steep.
- Particle Accelerators