Accession Number:

ADA291058

Title:

Investigation and Characterization of SEU Effects and Hardening Strategies in Avionics.

Descriptive Note:

Technical rept. 1 Oct 90-30 Sep 92,

Corporate Author:

BOEING DEFENSE AND SPACE GROUP SEATTLE WA

Personal Author(s):

Report Date:

1995-02-01

Pagination or Media Count:

93.0

Abstract:

Data from militaryexperimental flights and laboratory testing indicate that typical non-radiation-hardened 64k and 256k static random access memories SRAMs can experience a significant soft upset rate at aircraft altitudes due to energetic neutrons created by cosmic ray interactions in the atmosphere. It is suggested that error detection and correction EDAC circuitry be considered for all new avionics designs containing large amounts of semiconductor memory. MM

Subject Categories:

  • Aircraft
  • Astrophysics
  • Electrical and Electronic Equipment

Distribution Statement:

APPROVED FOR PUBLIC RELEASE