Accession Number:

ADA289841

Title:

The In Situ Observation of Epitaxial Diamond Thin Film Nucleation and Growth Using Emission Electron Microscopy.

Descriptive Note:

Semiannual technical rept. 1 Jan-30 Jun 94,

Corporate Author:

OHIO UNIV ATHENS DEPT OF PHYSICS

Personal Author(s):

• Kordesch, Martin E.

Report Date:

1995-01-02

Pagination or Media Count:

70.0

Abstract:

A variety of natural and chemical vapor deposited diamond surfaces have been imaged using a photoelectron emission microscope and synchrotron radiation in the 4-18 eV and 250-350 eV range. Both images and spatially resolved total electron yield curves were acquired simultaneously. Near-edge spectra at the carbon is edge show a resonance due to graphite the image intensity varies uniformly in proportion to the C 1s edge intensity. In the 4-18 eV range, no sharp features related to a photoemission threshold were observed below 7 eV in the electron yield curves on any of the specimens. The image contrast was not strongly dependant on the illumination energy. Natural type IIa diamond showed severe charging effects. jg

Descriptors:

• *EMISSION
• *THIN FILMS
• *DIAMONDS
• *EPITAXIAL GROWTH
• *NUCLEATION
• *ELECTRON MICROSCOPY
• CONTRAST
• EDGES
• THRESHOLD EFFECTS
• ENERGY
• INTENSITY
• CHEMICAL VAPOR DEPOSITION
• GRAPHITE
• ILLUMINATION
• CARBON
• PHOTOELECTRIC EMISSION
• IMAGES
• DIFFUSION
• SULFUR
• PHOTOELECTRONS
• SYNCHROTRON RADIATION
• SHARPNESS

Subject Categories:

• Inorganic Chemistry
• Physical Chemistry
• Crystallography
• Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE