Accession Number:

ADA289806

Title:

Thin-Film Resistor Array Characterization.

Descriptive Note:

Final rept. Jan-Jun 94,

Corporate Author:

ARMY MISSILE COMMAND REDSTONE ARSENAL AL SYSTEMS SIMULATION AND DEVELOPMENT DIRECTORATE

Personal Author(s):

• Sanderford, Vicki
• Mobley, Scott

Report Date:

1994-12-01

Pagination or Media Count:

72.0

Abstract:

This paper provides the results of thin-film resistor array testing which was recently performed at the System Simulation and Development Directorate SSDD, Research, Development, and Engineering Center RDEC. The objective of these tests was to determine the suitability of the Australian thin-film resistor technology for use as a key component in an Infrared Scene Projector IRSP for Hardware-in-the-Loop HWIL simulations involving systems which utilize linear rows of detectors. The tests were configured to measure spatial uniformity, temporal response, dynamic range, and relative energy output as a function of power input. D65O funding was used to purchase the resistor arrays. MM

Descriptors:

• *INFRARED DETECTORS
• *THIN FILM RESISTORS
• THERMAL PROPERTIES
• COMPUTERIZED SIMULATION
• FOREIGN TECHNOLOGY
• TEMPERATURE
• PHYSICAL PROPERTIES
• ARRAYS
• VOLTAGE
• SUBSTRATES
• CAMERAS
• INFRARED RADIATION
• BLACKBODY RADIATION
• AUSTRALIA
• EMITTERS
• AMPLITUDE
• IMAGE PROJECTORS

Subject Categories:

• Electrical and Electronic Equipment
• Electrical and Electronic Equipment

Distribution Statement:

APPROVED FOR PUBLIC RELEASE