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Experimental Methods in Residual Stress Measurement Using a Position-Sensitive Single-Exposure Scintillation Detection System.
ARMY ARMAMENT RESEARCH DEVELOPMENT AND ENGINEERING CENTER WATERVLIET NY BENET LABS
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In the Denver D-1000-A single-exposure position-sensitive scintillation detection PSSD system, surface residual stress measurement in any chosen direction is based on crystalline plane spacings determined in two directions normal to the surface made simultaneously in a single psi tilt. This technical allows fast, noncontacting, and nondestructive biaxial stress analysis. In this report, system performance is characterized by studying the noise, gain, and diffraction peak profiles as a function of diode array element. A four-point bend experiment was performed to determine the elastic constant of the 211 plane of body-centered cubic martensitic steel. Residual stress measurements were performed in several steel specimens and compared to measurements made on a similar system at Pennsylvania State University. Local software development allowed the single-exposure PSSD to run in a multiple-exposure mode for improved accuracy in biaxial stress analysis. MM
APPROVED FOR PUBLIC RELEASE