Accession Number:

ADA289803

Title:

Experimental Methods in Residual Stress Measurement Using a Position-Sensitive Single-Exposure Scintillation Detection System.

Descriptive Note:

Final rept.,

Corporate Author:

ARMY ARMAMENT RESEARCH DEVELOPMENT AND ENGINEERING CENTER WATERVLIET NY BENET LABS

Personal Author(s):

• Lee, S. L.
• Doxbeck, M.
• Capsimalis, G. P.

Report Date:

1994-09-01

Pagination or Media Count:

33.0

Abstract:

In the Denver D-1000-A single-exposure position-sensitive scintillation detection PSSD system, surface residual stress measurement in any chosen direction is based on crystalline plane spacings determined in two directions normal to the surface made simultaneously in a single psi tilt. This technical allows fast, noncontacting, and nondestructive biaxial stress analysis. In this report, system performance is characterized by studying the noise, gain, and diffraction peak profiles as a function of diode array element. A four-point bend experiment was performed to determine the elastic constant of the 211 plane of body-centered cubic martensitic steel. Residual stress measurements were performed in several steel specimens and compared to measurements made on a similar system at Pennsylvania State University. Local software development allowed the single-exposure PSSD to run in a multiple-exposure mode for improved accuracy in biaxial stress analysis. MM

Descriptors:

• *NONDESTRUCTIVE TESTING
• *STRESS ANALYSIS
• *X RAY DIFFRACTION
• *STEEL
• STRESS STRAIN RELATIONS
• COMPUTER PROGRAMS
• DIODES
• FIBER OPTICS
• PEAK VALUES
• STIFFNESS
• ELASTIC PROPERTIES
• MODULUS OF ELASTICITY
• CURRENT DENSITY
• X RAYS
• STRENGTH(MECHANICS)
• CRACK PROPAGATION
• DIFFRACTION
• RESIDUAL STRESS
• GAIN
• FATIGUE(MECHANICS)
• BIAXIAL STRESSES
• PIXELS
• PLASTIC FLOW
• POISSON RATIO
• SCINTILLATION COUNTERS
• X RAY TUBES
• ELECTROLYTIC POLISHING

Subject Categories:

• Metallurgy and Metallography
• Nuclear Physics and Elementary Particle Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE