Accession Number:

ADA286614

Title:

European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (5th)

Descriptive Note:

Conference proceedings, 4-7 Oct 1994

Corporate Author:

QA REL ASSOCIATES NORTHHAMPTON (UNITED KINGDOM)

Personal Author(s):

• Brydon, G. M.

Report Date:

1994-10-07

Pagination or Media Count:

608.0

Abstract:

The electronic component industry leads the world in the achievement of quality and reliability, whilst at the same time providing products and functionality at steadily reducing prices.

Descriptors:

• *RELIABILITY(ELECTRONICS)
• *FAILURE(ELECTRONICS)
• SYMPOSIA
• ELECTROOPTICS
• QUANTUM WELLS
• THIN FILMS
• INTEGRATED CIRCUITS
• AVALANCHE EFFECT(ELECTRONICS)
• UNITED KINGDOM
• PELTIER EFFECT
• BREAKDOWN(ELECTRONIC THRESHOLD)
• SEMICONDUCTOR DEVICES
• FIELD EFFECT TRANSISTORS
• MICROELECTRONICS
• QUANTUM ELECTRONICS
• THERMAL FATIGUE

Subject Categories:

• Electrical and Electronic Equipment
• Electricity and Magnetism
• Quantum Theory and Relativity

Distribution Statement:

APPROVED FOR PUBLIC RELEASE