DID YOU KNOW? DTIC has over 3.5 million final reports on DoD funded research, development, test, and evaluation activities available to our registered users. Click
HERE to register or log in.
Accession Number:
ADA281805
Title:
Resist Materials Design: Base-Catalyzed Chemical Amplification.
Descriptive Note:
Technical rept.,
Corporate Author:
CORNELL UNIV ITHACA NY DEPT OF CHEMISTRY
Report Date:
1994-06-30
Pagination or Media Count:
14.0
Abstract:
Many chemically amplified resists that function on the basis of acid catalysis of thermolytic actions have been described as well as systems that function on the basis of free radical chain reactions. But there have been very few reports on the use of base catalysis, of chemical transformations in resist materials. We describe here our initial results on base catalyzed chemically amplified deep-UV photoresists. Photogenerated amines were used as catalysts for the decarboxylation of carboxylic acids. Two approaches to building resists around this chemistry were investigated. 1 Decarboxylation of a low molecular weight carboxylic acid led to base induced dissolution inhibition of a phenolic polymer giving negative tone images. 2 A carboxylic acid polymer was synthesized which also is susceptible towards base catalyzed decarboxylation. Wet development of this resist material gives negative tone images. Site specific gas-phase silylation of the carboxylic acid allows the use of this material in a positive tone dry develop process. A 0.5 micrometers line-space pattern obtained by this dry develop process illustrates the potential of base-catalyzed chemical amplification. Resist, Photogenerated base, Chemical amplification, Microelectronics, Imaging material.
Distribution Statement:
APPROVED FOR PUBLIC RELEASE
