Accession Number:

ADA281522

Title:

BEEM 94. Annual Workshop on Ballistic Electron Emission Microscopy (5th) Held in New York on January 24, 1994

Descriptive Note:

Corporate Author:

CALIFORNIA UNIV SANTA BARBARA

Personal Author(s):

Report Date:

1994-01-24

Pagination or Media Count:

44.0

Abstract:

Partial contents Electron transport across interfaces and surfaces an overview BEEM studies of strain-tuned semiconductor interfaces Transport studies in semiconductor heterostructures using BEEM Spectroscopic studies of quantum-wells and -wires using an STM BEEM in pinholes of NiS2 films on n- Si111-7x7 determination of the impact ionization quantum yield in Si Low- temperature UHV BEEM of epitaxial CoSi2Si111 Interfacial barrier studies of epitaxial CoGa on n-type 100 GaAs with BEEM BEEM on AuSi1117x7 and Au CaF2Si1117x7 Temperature dependence of Schottky barriers as probed by BEEM Nanoscopic barrier height distributions at metalsemiconductor interfaces and observation of critical lengths BEEM studies of reversed-biased Schottky diodes Ballistic models applied to low-temperature BEEM measurements of AuSi interfaces Electron inelastic mean free path and spatial resolution of BEEM.

Subject Categories:

  • Electrooptical and Optoelectronic Devices
  • Optics
  • Nuclear Physics and Elementary Particle Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE