Combined Atomic Force and Scanning Reflection Interference Contrast Microscopy
Technical rept. No. 12, 1 Jan-31 Dec 1994
CALIFORNIA UNIV SANTA BARBARA DEPT OF PHYSICS
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A sphere attached to a cantilever is used simultaneously as an atomic force microscope AFM tip and as a curved reflective surface for producing scanning reflection interference contrast microscope RICM images of fluorescent beads dried onto a glass slide. The AFM and RICM images are acquired in direct registration which enables the identification of individually excited beads in the AFM images. The addition of a sharp, electron beam-deposited tip to the sphere gives nanometer resolution AFM images without loss of optical contrast. Method of combining an Atomic Force Microscope AFM with a Reflection, Interference Contrast Microscope RICM.
- Test Facilities, Equipment and Methods
- Particle Accelerators