Accession Number:

ADA280341

Title:

Combined Atomic Force and Scanning Reflection Interference Contrast Microscopy

Descriptive Note:

Technical rept. No. 12, 1 Jan-31 Dec 1994

Corporate Author:

CALIFORNIA UNIV SANTA BARBARA DEPT OF PHYSICS

Personal Author(s):

• Hillner, P. E.
• Radmacher, M.
• Hansma, P. K.

Report Date:

1994-09-01

Pagination or Media Count:

15.0

Abstract:

A sphere attached to a cantilever is used simultaneously as an atomic force microscope AFM tip and as a curved reflective surface for producing scanning reflection interference contrast microscope RICM images of fluorescent beads dried onto a glass slide. The AFM and RICM images are acquired in direct registration which enables the identification of individually excited beads in the AFM images. The addition of a sharp, electron beam-deposited tip to the sphere gives nanometer resolution AFM images without loss of optical contrast. Method of combining an Atomic Force Microscope AFM with a Reflection, Interference Contrast Microscope RICM.

Descriptors:

• *SCANNING
• *CONTRAST
• *REFLECTION
• *MICROSCOPY
• *INTERFERENCE
• *ATOMIC PROPERTIES
• OPTICS
• FLUORESCENCE
• SURFACES
• ELECTRON BEAMS
• BEADS
• CANTILEVER BEAMS
• IMAGES
• ELECTRONS
• IDENTIFICATION
• EXCITATION
• RESOLUTION
• GLASS
• SPHERES

Subject Categories:

• Test Facilities, Equipment and Methods
• Optics
• Particle Accelerators

Distribution Statement:

APPROVED FOR PUBLIC RELEASE