Accession Number:

ADA280219

Title:

Fault Tolerance in Opto-electronic Computing.

Descriptive Note:

Semi-annual rept.,

Corporate Author:

CALIFORNIA UNIV DAVIS DEPT OF ELECTRICAL AND COMPUTER ENGINEERING

Personal Author(s):

• Lin, Ting-Ting Y.

Report Date:

1994-04-15

Pagination or Media Count:

46.0

Abstract:

This project has gotten some recognition in both fault modeling and testing of optical interconnects in a opto-electronic system. In the first part, we want to develop a new methodology for performance analysis of opto-electronic systems at a higher level. Our approach is to first identify possible failures in such interconnect implementations, and then extract information from the physical configuration and relate to the system performance parameters. In this way, system-level performance degradation can be estimated to construct design constraint for physical systems. In the second part on testing, we proposed an architecture which integrates the concept of concurrency and distributed test pattern generation for testing complex circuits on a planar layout.

Descriptors:

• *ELECTROOPTICS
• *CIRCUIT INTERCONNECTIONS
• *OPTICAL CIRCUITS
• *FAULT TOLERANT COMPUTING
• COMPUTERIZED SIMULATION
• SYSTEMS ANALYSIS
• CIRCUIT TESTERS
• COMPUTER NETWORKS
• COMPUTER ARCHITECTURE
• METHODOLOGY

Subject Categories:

• Electrooptical and Optoelectronic Devices

Distribution Statement:

APPROVED FOR PUBLIC RELEASE