Accession Number:

ADA280065

Title:

Prototype Rule-Based Reliability Analysis for VLSI Circuit Design

Descriptive Note:

Final rept. Oct 1992-Oct 1993

Corporate Author:

ILLINOIS UNIV AT URBANA COORDINATED SCIENCE LAB

Personal Author(s):

• Kang, Sung-Mo
• Leblebici, Yusuf
• Sun, Weishi
• Teng, Chin-Chi

Report Date:

1994-04-01

Pagination or Media Count:

82.0

Abstract:

This report describes the development and application of parametric and geometry based macro-models of hot-carrier induced dynamic degradation in MOS VLSI circuits. Previously, a simulation based approach has been used for reliability analysis, but this is inefficient for reliability assessment of very large scale integrated circuits. Geometry-based macro-models for hot-carrier reliability estimation have been developed. The macro-models express hot-carrier damage as functions of designable parameters such as transistor size W, output loading capacitance C1 and the input signal slew rate a. A prototype rule- based reliability diagnosis tool, iRULE, has been developed. This tool uses the macro-models for designing hot-carrier resistant circuits without the need for transient reliability simulations. This provides the ability to analyze very large circuits with more than one million transistors on a workstation in a short amount of time. This report also describes a fast timing reliability simulation tool, ILLIADS-R, that can accurately estimate hot-carrier degradation while providing several orders of magnitude speed up over traditional transistor-level circuit simulators. Reliability, Hot-carrier degradation, VLSI CMOS Circuits, Simulation.

Descriptors:

• *VERY LARGE SCALE INTEGRATION
• *RULE BASED SYSTEMS
• *PROTOTYPES
• *CIRCUIT TESTERS
• VELOCITY
• MATHEMATICAL MODELS
• COMPUTERIZED SIMULATION
• SIMULATORS
• INPUT
• OUTPUT
• SCHEMATIC DIAGRAMS
• RELIABILITY(ELECTRONICS)
• SYSTEMS APPROACH
• GEOMETRY
• SIGNALS
• SCALE
• TIME
• ESTIMATES
• INTEGRATED CIRCUITS
• APPROACH
• CAPACITANCE
• TRANSISTORS
• TRANSIENTS
• DAMAGE
• DEGRADATION
• COMPUTER AIDED DESIGN
• TOOLS
• PARAMETERS
• RATES

Subject Categories:

• Electrical and Electronic Equipment
• Computer Programming and Software

Distribution Statement:

APPROVED FOR PUBLIC RELEASE