Accession Number:

ADA278134

Title:

The Impact of ASIC Devices on the SEU Vulnerability of Space-Borne Computers.

Descriptive Note:

Technical rept.,

Corporate Author:

AEROSPACE CORP EL SEGUNDO CA TECHNOLOGY OPERATIONS

Personal Author(s):

• Koga, R.
• Crain, W. R.
• Crawford, K. B.
• Hansel, S. J.
• Pinkerton, S. D.

Report Date:

1994-01-30

Pagination or Media Count:

14.0

Abstract:

Application specific integrated circuits ASICs offer a number of advantages over traditional multi-component microcircuits including reductions in both size and power dissipation, and are therefore prime candidates to replace such microcircuits in space-borne electronics systems. The results of recent tests of the susceptibilities of various ASIC devices to cosmic ray and trapped proton induced single event upset SEU and latchup are reported here and are compared to the susceptibilities of the devices that they would replace. This comparison leads to a discussion of the impact of ASIC devices on the SEU susceptibility of space-borne computers. ASIC, SEU, FPGA, PLA, PLD, CMOS, LSI, SSI, MSI, Latchup, Spaceborne computer.

Descriptors:

• *ELECTRONICS
• *IMPACT
• *MICROELECTRONICS
• *REPLACEMENT
• *LARGE SCALE INTEGRATION
• TEST AND EVALUATION
• COMPUTERS
• SPACEBORNE
• COSMIC RAYS
• POWER
• COMPARISON
• VULNERABILITY
• DISSIPATION
• PROTONS
• REDUCTION

Subject Categories:

• Electrical and Electronic Equipment

Distribution Statement:

APPROVED FOR PUBLIC RELEASE