Final Progress Report on ONR Grant N00014-90-J-1691 (University of North Texas, Denton. Department of Physics)
UNIVERSITY OF NORTH TEXAS DENTON DEPT OF PHYSICS
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Because of the high sensitivities and small sample size capabilities, an Accelerator Mass Spectrometry AMS system has been constructed at the Ion Beam Modification and Analysis Laboratory IBMAL at the University of North Texas. The AMS system, which has been developed through a collaboration with Texas Instruments Inc., the National Science Foundation, and the Office of Naval Research has been applied to trace element analysis of stable isotopes in electronic materials. The terminal charge stripping inherent with tandem accelerator operation allows molecular interferences to be removed. The interferences of molecules that have approximately the same mass as the element of interest e.g. 28Si2 and 56Fe are one of the primary limits to high sensitivities for SIMS. Because AMS has increased sensitivities over SIMS for some elements by factors of 100 to 1000 due to the removal of molecular interferences, AMS is sometimes called Super-SIMS. The unique capabilities of AMS allow new and more sensitive methods for the characterization of trace impurities in electronic materials.
- Electrical and Electronic Equipment
- Laminates and Composite Materials
- Nuclear Physics and Elementary Particle Physics