Accession Number:

ADA276229

Title:

Microforces in Electromigration

Descriptive Note:

Final rept. Sep 1989-Oct 1992

Corporate Author:

WISCONSIN UNIV-MILWAUKEE DEPT OF PHYSICS

Personal Author(s):

Report Date:

1993-12-01

Pagination or Media Count:

53.0

Abstract:

Theoretical description of electromigration EM in metallic microstructures. How EM in a small metallic system is affected by surfaces, interfaces, and extended defects e.g. grain boundaries and dislocations. Electronic aspects of EM and dynamical atom response to current emphasizing mesoscopic systems. Calculated local transport field in very small structures near grain boundary or dislocation and probeability by scanning tunneling microscope. Investigated inelastic scattering effects on electrical conductivity and EM of migrating impurity. Pauli-blocking effects induce nonlinearities in the electron and atom response. Mesoscopic systems show this more strongly than bulk systems because Fermi-distribution can be strongly perturbed in state with current. Investigated impurity heating by electron current, quantummechanical dynamics of interacting atom-lattice-electron system included found effective temperature as function of time. Net atom flux expressed in terms of effective driving force in Nernst-Einstein relation in phonon-assisted diffusion of light interstitials driving force can be much smaller than from previous theories. Generalization to non-adiabatic effects on electron screening and direct force for EM. Investigated dynamics in complementary classical diffusion processes First numerical simulations of atomic level EM. Significant enhancement of light interstitial EM from. Electromigration, Quantum mechanics, Mesoscopic, Transport fields.

Subject Categories:

  • Physical Chemistry
  • Electricity and Magnetism
  • Atomic and Molecular Physics and Spectroscopy
  • Quantum Theory and Relativity

Distribution Statement:

APPROVED FOR PUBLIC RELEASE