The Influence of Temperature on Microelectronic Device Failure Mechanisms. Phase 2
RAMSEARCH CO CROFTON MD
Pagination or Media Count:
There has been a common belief that reliable electronics can be achieved by lowering temperature. Elevated temperature has in the past been considered a dominant stress that lowers reliability, so every effort has been made to lower operating temperature until the desired reliability is achieved. The belief in the harmful effects of temperature has woven itself into todays screening and thermal derating processes. High-reliability applications require that the microelectronic device be subjected to high-temperature stress screens, like burn-in, to improve the reliability of the product. Moreover, thermal derating measures for microelectronics often involve lowering temperature.
- Electrical and Electronic Equipment