Accession Number:

ADA272251

Title:

Direct Imaging of the Surface Microstructure of Dielectric Materials Using an Atomic Force Microscope

Descriptive Note:

Final technical rept.

Corporate Author:

MAINE UNIV AT ORONO LAB FOR SURFACE SCIENCE AND TECHNOLOGY

Personal Author(s):

• Unertl, W. N.
• Lad, R. J.

Report Date:

1993-09-24

Pagination or Media Count:

11.0

Abstract:

An atomic force microscope was acquired and used to study the surface properties of polymers and ceramics. Studies of polymers included nanomachining, mechanical properties, wetting behavior of latex, and metallization. Studies of ceramics included faceting of TiO2 morphology of oxide fracture surfaces, heteroepitaxial oxide film growth, and oxidation of vanadium carbide. A prototype instrument for use in ultra-high vacuum was designed.

Descriptors:

• *MICROSTRUCTURE
• *DIELECTRICS
• *SURFACE PROPERTIES
• *MICROMECHANICS
• *IMAGES
• MECHANICAL PROPERTIES
• MACHINING
• POLYMERS
• PROTOTYPES
• CARBIDES
• CERAMIC MATERIALS
• HIGH VACUUM
• METALLIZING
• LATEX
• ULTRAHIGH VACUUM
• VANADIUM
• MICROSCOPES
• OXIDES
• OXIDATION
• WETTING
• SURFACES
• EPITAXIAL GROWTH
• ADHESION
• MORPHOLOGY
• STRUCTURES
• THIN FILMS

Subject Categories:

• Physical Chemistry
• Polymer Chemistry
• Ceramics, Refractories and Glass
• Optics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE