Accession Number:

ADA270719

Title:

VLSI Design for Reliability-Current Density

Descriptive Note:

Final rept. May 91-Sep 92,

Corporate Author:

ILLINOIS UNIV AT URBANA COORDINATED SCIENCE LAB

Report Date:

1993-07-01

Pagination or Media Count:

26.0

Abstract:

This effort emphasizes the computation of the average and variance current density waveforms in the metal buses for estimating the MTF for electromigration effects. That effort is composed of two parts The probabilistic simulation methods and software for computing the statistics of the current waveform at contact points to the buses and the accurate extraction of the equivalent RC model of the bus for analyzing the bus currents. In addition, probabilistic methods have been applied to the calculation of the hot electron degradation in digital CMOS circuits, and the problem of estimating the maximum current as opposed to the average in the bus for worst case voltage drop analysis.

Subject Categories:

  • Electrical and Electronic Equipment
  • Computer Programming and Software

Distribution Statement:

APPROVED FOR PUBLIC RELEASE