Accession Number:

ADA270129

Title:

Thin Film Studies of the Proximity Josephson Effect

Descriptive Note:

Final technical rept. 15 Apr 1991-14 Apr 1993

Corporate Author:

POLYTECHNIC UNIV BROOKLYN NY DEPT OF PHYSICS

Personal Author(s):

Report Date:

1993-09-01

Pagination or Media Count:

11.0

Abstract:

The topics of theoretical and experimental interest in this research have been The Proximity Induced Josephson Effect PIJE, an effect occurring at a Normal MetalSuperconductor NS interface which displays many of the features of the Josephson effect, the device potential of which has not been at all explored. The design and construction of a cryogenic scanning tunneling microscope capable of operating in ultra high vacuum. The Proximity Induced Josephson Effect PIJE has been observed at a Normal MetalSuperconductor NS interfaces in point contact NS systems, and displays features resembling the Josephson effect. In experiments with Nb and Ta probes contacting MO and UBe13 normal state surface, the IV exhibit a low resistance segment centered at zero bias current resembling a Josephson current with a small series resistance R, which has been interpreted as a spreading resistance in the normal state electrode.

Subject Categories:

  • Electrical and Electronic Equipment
  • Electricity and Magnetism
  • Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE