Accession Number:

ADA265674

Title:

Atomic-Scale Imaging of Surfaces and Interfaces. Materials Research Society Symposium Proceedings Held in Boston, Massachusetts on November 30-December 2, 1992. Volume 295

Descriptive Note:

Corporate Author:

MATERIALS RESEARCH SOCIETY PITTSBURGH PA

Report Date:

1992-01-01

Pagination or Media Count:

290.0

Abstract:

The gap between imagining and imaging is getting ever smaller. Atomic-Scale Imaging of Surfaces and Interfaces, Symposium W at the 1992 MRS fall Meeting in Boston, Massachusetts, brought together researchers using most state-of-the-art imaging techniques capable of resolving atomic features. Methods represented were scanning tunneling microscopy STM, atomic force microscopy AFM, low energy electron microscopy LEEM, transmission TEM and reflection REM electron microscopy, scanning electron microscopy SEM, atom probe field ion microscopy APFIM or POSAP, high and low energy external source electron holographies and internal source electron holographies. Some highlights from the STM papers included discussions of the limitations and future potential of STM as well as current findings. Several papers presented work with STM at elevated temperatures. Jene Golovchenko reviewed STM work showing cooperative diffusion events Pb on Ge involving many tens of substrate atoms. Don Eigler focused on atomic manipulation and some of its uses to enable fundamental studies of small atomic clusters.

Subject Categories:

  • Physical Chemistry
  • Crystallography
  • Atomic and Molecular Physics and Spectroscopy
  • Optics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE