Final Progress Report for Contract N00014-91-J-1785 (University of North Texas, Denton. Department of Physics),
UNIVERSITY OF NORTH TEXAS DENTON DEPT OF PHYSICS
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An accelerator mass spectrometry AMS facility has been developed at the Ion Beam Modification and Analysis Laboratory IBMAL at the University of North Texas UNT in conjunction with the 3 MV Tandem Accelerator. The computer controlled AMS instrument allows automatic mass scans of stable isotopes in solid materials using a new ultra-clean, low sample contamination ion source. The AMS instrument allows molecular interference-free mass scans to be obtained with a higher sensitivity than Secondary Ion Mass Spectrometry SIMS for many elements. The new low sample contamination, microbeam, raster-scanning, depth-profiling ion source recently completed should allow sensitivities of ppt 1 part in 10exp 12 or 10exp 10 atomscu cm for almost any element in the periodic table as well as secondary electron imaging of a sample. Raster scanning and depth profiling capabilities are available. These should be ready for routine use by the third quarter of 1993. Microbeam capabilities should be available by the third quarter of 1993.
- Nuclear Physics and Elementary Particle Physics