Spatial Light Modulators (SLMs) Surface Quality
Final technical rept. 1 Jun-1 Sep 1992
ARMY MISSILE COMMAND REDSTONE ARSENAL AL WEAPONS SCIENCE DIRECTORATE
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The phase modulating properties of spatial light modulators SLMs have been investigated for optical pattern recognition purposes for many years. An interferometric microscope was recently utilized to investigate the surface uniformity, and thus phase distortion, of several SLMs that are commercially available. These interferometric results are presented here and verify that the optical uniformity of SLMs should be considered when phase modulating properties of the devices are to be applied in optical systems.
- Electrooptical and Optoelectronic Devices