Accession Number:

ADA261391

Title:

Multichip Module High Speed Testing

Descriptive Note:

Quarterly progress rept. 1 Oct-31 Dec 1992

Corporate Author:

COLUMBIA UNIV NEW YORK DEPT OF ELECTRICAL ENGINEERING

Personal Author(s):

Report Date:

1992-12-31

Pagination or Media Count:

3.0

Abstract:

Work is proceeding on the testing of high-speed circuits using poled electrooptic polymers. Coplanar electrodes with thin layer 3 microns coatings of a copolymer system. The samples were poled at their glass transition temperature of 132 deg C at a poling field of 0.50 MVcm. The response was measured in transmission mode through the electrode gap using a Tisapphire laser and a lock-in amplifier.

Subject Categories:

  • Electrooptical and Optoelectronic Devices

Distribution Statement:

APPROVED FOR PUBLIC RELEASE