Multichip Module High Speed Testing
Quarterly progress rept. 1 Oct-31 Dec 1992
COLUMBIA UNIV NEW YORK DEPT OF ELECTRICAL ENGINEERING
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Work is proceeding on the testing of high-speed circuits using poled electrooptic polymers. Coplanar electrodes with thin layer 3 microns coatings of a copolymer system. The samples were poled at their glass transition temperature of 132 deg C at a poling field of 0.50 MVcm. The response was measured in transmission mode through the electrode gap using a Tisapphire laser and a lock-in amplifier.
- Electrooptical and Optoelectronic Devices