Accession Number:



Interaction of 02 with the Fe.84 Cr.16 (001) Surface Studied by Photoelectron Spectroscopy

Descriptive Note:

Corporate Author:


Report Date:


Pagination or Media Count:



The surface oxidation of a steel-like alloy was investigated to help determine how the efficiency of lubricant additives such as lead naphthenate might be affected by the chemical state of a high-Cr steel bearing surface. Soft X-ray photoelectron spectroscopy SXPS hv 130 - 600 eV employing synchrotron radiation and X-ray photoelectron spectroscopy XPS hv 1486.6 eV employing Al-K alpha X rays were used to study the effect of molecular oxygen adsorption 1 to 10exp 4 L, where 1L triple bonds 10exp-6 Torr-sec on the 001 surface of Fe sub .84 Cr sub .16 at room temperature. The use of multiple photon energies allowed a qualitative determination of the distribution of species in the oxide film perpendicular to the surface. Prior to oxidation, Fe sub .84 Cr sub .16 samples were annealed to different temperatures to produce varying concentrations of Cr in the top few monolayers of the 001 surface. The differences between the oxide films produced on these different surfaces were determined with SXPS using primarily the Fe 3p, Cr 3p, and valence levels. Small amounts of carbidic carbon less than or equal to 1 monolayer that had segregated to the 001 surface of the Fe sub .84 Cr sub .16 alloy during initial sputteranneal treatments were removed during the first approx. 5 L 02 exposure. In general, the resistance of the Fe sub .84 Cr sub .16001 surface to oxidation was directly related to the initial Cr concentration at the surface. The oxide films were richer in Cr compared to the bulk concentration for the lowest 02 exposures, and became increasingly enriched in Fe for increasing exposures, in agreement with studies by other groups. The resulting mixed Fe-Cr-O film contained Cr in the form of Cr3 for all exposures.

Subject Categories:

  • Physical Chemistry
  • Metallurgy and Metallography
  • Lubricants and Hydraulic Fluids
  • Atomic and Molecular Physics and Spectroscopy

Distribution Statement: