Accession Number:

ADA257712

Title:

Scan-Based Switching Tests

Descriptive Note:

Final technical rept.

Corporate Author:

HARRIS CORP MELBOURNE FL GOVERNMENT INFORMATION SYSTEMS DIV

Personal Author(s):

Report Date:

1992-07-01

Pagination or Media Count:

52.0

Abstract:

This report describes an algorithm for generating scan-based switching tests. The only design consideration required by this algorithm, besides the scan design is the capability to execute two functional clocks with a desired interval between logic scans. The algorithm generates a test vector which is scanned in to cause the source register of the delay path to toggle on the first clock, and captures a transition at the output register of the delay path on the second clock. The algorithm also identifies paths that are not testable, and identifies the points of conflict.

Subject Categories:

  • Test Facilities, Equipment and Methods

Distribution Statement:

APPROVED FOR PUBLIC RELEASE