Group II Cubic Fluorides as Dielectrics for 3-D Integration and GaAs-Based Optoelectronic Structures
Final rept. Jun 1989-May 1992
PRINCETON UNIV NJ DEPT OF ELECTRICAL ENGINEERING
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The epitaxial growth of CaxSr1-xF2GaAs100 and GaAsCaxSr1-xF2l00 is investigated. Optimum growth temperature of 5300C, growth rate of 1A sec and composition x0.47 lead to very high crystallinity layers of mixed fluorides on GaAs. The growth of GaA.sCa0.47Sr0.53F2100, rendered much more difficult by the morphology and faceting of the insulating surface, is substantially improved by modifying the fluoride surface by electron irradiation prior to GaAs growth, and by a two-step growth sequence where the interface GaAs is grown at low temperature 300 deg C. Finally, the patterning of the fluoride layer is performed by e-beam exposure. Features as small as 1 micron are drawn and developed on a 2060 deg thick CaF2 layer, opening the possibility of using the fluorides for wave-guides or re-growth of small III-V features.
- Electrooptical and Optoelectronic Devices
- Solid State Physics