Programme and Abstracts. Workshop on Expert Evaluation and Control of Compound Semiconductor Materials and Technologies (1st) Held in Ecole Centrale De Lyon, France on 19 -22 May 1992. (EXAMTEC' 92)
ECOLE CENTRALE DE LYON ECULLY (FRANCE)
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This workshop included the following topics Performance and reliability of micro-optoelectronic devices in connection with material properties and process conditions. Material Related Issues and Their Characterization in View of III-V Heterojunction Device Optimization Material Problems for the Development of InGaAsInA1As HEMTs Technology Theoretical and Experimental Study of Failure Mechanisms in RF Reliability Life Tested HEMTs A Study of Detrimental Transient Effects in GaAs HEMTs Relating Micron Wave Mapped Data to Physical Parameters for MODFETs Performance and reliability of micro-optoelectronic devices in connection with material properties and process conditions Material Related Reliability Aspects of III-V Optical Devices A possible Origin of Degradation Mechanisms in A1GaAsGaAs Laser-Like Structures Thermal Stability of Pseudomorphic HEMTs Detailed Process Analysis for Controlling the Yield of GaAs MMICs Technology Spatially Resolved Photoluminescence Techniques Applied to the Control of InGaAsPInP Laser Processing Growth and characterization of epitaxial structures Atomic Ordering and Phase Separations in Compound Semiconductors and their Effect on Device Behavior Improved Device Quality by Strained Layer Epitaxy II-VI Semiconductor Strained Heterostructures A Structural Review and Interface Properties of Strained InGaAsInP Quantum Wells Grown by LP-MOVPE.
- Electrical and Electronic Equipment