Accession Number:

ADA247192

Title:

Smart BIT/TSMD Integration

Descriptive Note:

Final Technical rept. Sep 1989-Jan 1991

Corporate Author:

GRUMMAN AEROSPACE CORP BETHPAGE NY

Report Date:

1991-12-01

Pagination or Media Count:

190.0

Abstract:

The problem of false alarms and intermittent failures of electronics continually manifest themselves in high levels of Cannot Duplicate CND and Retest OK RETOK reports. These conditions lead to an excessive drain on resources including spares, manpower and test equipment and ultimately produce a negative impact on mission readiness. A major contributor of false alarms intermittents is that of external environmental factors. Smart Built-in Test Smart BIT uses environmental stress data as inputs to its artificial intelligence based reasoning process for detecting false alarms, and Time Stress Measurement Device TSMD technology provides a capability to measure, collect and store stress data for failure correlation, although with minimal attention to date to real-time applications Until now, these technologies were independent research and development activities. This report discusses the integration of these technologies. A self contained laboratory testbed was developed to support this research. Hardware and software computer design and development necessary to investigate and complete the integration are detailed. Methods for simulating the environment based on real world data as well as actual sensor hardware implementations were developed. Guidelines for installing actual electronics in the testbed are provided along with conclusions and recommendations for fielding an integrated capability.

Subject Categories:

  • Cybernetics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE