Accession Number:

ADA243813

Title:

Radiation Effects Test Chip Guidelines

Descriptive Note:

Final rept. 28 Feb 1987-8 Feb 1991

Corporate Author:

MISSION RESEARCH CORP ALBUQUERQUE NM

Personal Author(s):

Report Date:

1991-11-01

Pagination or Media Count:

194.0

Abstract:

Test chips and special test structures are assuming a role of ever increasing importance in the development of radiation-hardened microcircuits. The reason for this expanding role lies in the expense and complexity of VHSIC very high speed integrated circuits and VLSIC very large scale integrated circuits class microcircuits. Special devices are required to 1 investigate failure mechanisms, 2 evaluate process hardness, 3 develop design rules, and 4 provide for hardness assurance monitoring. The purpose of this document is to provide information on a variety of devices which have been found useful in developing radiation-hardened microcircuits for metal oxide semiconductor epibulk, SOS, and SOI and bipolar technologies.

Subject Categories:

  • Electromagnetic Shielding
  • Solid State Physics

Distribution Statement:

APPROVED FOR PUBLIC RELEASE