A Rigorous UTD Analysis of Electromagnetic Scattering from Resistive Strips and Resistive-Loaded Conducting Strips
AIR FORCE INST OF TECH WRIGHT-PATTERSON AFB OH
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This thesis investigates electromagnetic scattering from resistive strips and resistive-loaded conducting strips using a rigorous UTD formulation. The UTD diffraction coefficients are based on the Wiener-Hopf technique and Jones method. Scattering predictions are performed for constant resistive strips, constant resistive-loaded conducting strips, tapered resistive strips, and tapered resistive-loaded conducting strips. All strip geometries have a total width of 4 lambda. Predictions are compared to method of moments MM and measurements to determine the validity of the UTD prediction. Overall, there is good agreement. For TMz polarization the only deviations that occur with MM are near edge-on when the degree of the taper increases. For TEz polarization deviations with MM occur near edge-on for all strip geometries except constant resistive strips. Comparisons with measurement are better for TMz except for constant resistive strips. Limitations are explored for tapered resistive strips and tapered resistive-loaded conducting strips based on edge-on scattering levels for TMz polarization. From these limitations scattering characteristics of resistive-loaded conducting strips are explored.
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