Accession Number:
ADA243652
Title:
Electrically Erasable Programmable Integrated Circuits for Replacement of Obsolete TTL Logic
Descriptive Note:
Master's thesis,
Corporate Author:
AIR FORCE INST OF TECH WRIGHT-PATTERSON AFB OH SCHOOL OF ENGINEERING
Personal Author(s):
Report Date:
1991-12-01
Pagination or Media Count:
240.0
Abstract:
Two microcircuits with electrically erasable programmable logic arrays, which use Fowler-Nordheim F-N tunneling for both programming and erasing, were designed to demonstrate the use of programmable logic for obsolete TTL logic replacement. Each microcircuit was fabricated in the Orbit 2-micron double-poly low noise analog CMOS process through MOSIS. Software to generate VHDL structural models from a pin list was developed and the logic of both designs was verified by simulation using the Zycad VHDL simulator. The first microcircuit included a simple programmable logic circuit and test cells that allowed measurement of the programming characteristics of the floating gate transistors. Test result on this microcircuit show a wide variance of programmability even between similar transistors on the same die. Some evidence of F-N tunneling from the control gate to the floating gate was also noted. The second microcircuit was designed to emulate the logic of a group of combinational TTL circuits. VHDL simulation was successful for each emulation. Device testing provided limited results due to a design error however, successful emulation of two sections of a 7400 quad-NAND circuit was achieved. Author
Descriptors:
Subject Categories:
- Electrical and Electronic Equipment