A PC Program to Calculate the One-Sided Lower Tolerance Limit for Total Ionizing Dose Radiation Data
Final rept. Sep 90-Jan 91,
HARRY DIAMOND LABS ADELPHI MD
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The radiation level of a semiconductor part type can be found to be just above the level needed for survivability. Many times the part has to be accepted or rejected lot to lot lot qualification on the basis of radiation data from small a sample of the lot. One-sided lower-tolerance -limit statistics is used on the radiation data to determine lot acceptance or rejection. An IBM- compatible PC program, written to calculate the one-sided lower tolerance limit at 90- to 50-percent confidence for log-normally distributed radiation data the usual distribution for semiconductor radiation data, is described in this report. The analysis results can be displayed in tabular and graphical form on the PC screen and a hard copy made on the printer.
- Nuclear Radiation Shielding, Protection and Safety